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Volumn 38, Issue 1-2, 1996, Pages 9-15

Fractal surface characterization of chalcogenide electrodeposits

Author keywords

Electrodeposits; Iron sulphide; Thin films; Zinc telluride

Indexed keywords

ATOMIC FORCE MICROSCOPY; CYCLIC VOLTAMMETRY; ELECTROCHEMISTRY; ELECTRODEPOSITION; FILM GROWTH; FRACTALS; OXIDES; SUBSTRATES; SURFACES;

EID: 0003021292     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(95)01240-0     Document Type: Article
Times cited : (6)

References (26)
  • 21
    • 36549100793 scopus 로고
    • P. Meakin, in D. Avnir (ed.), The Fractal Approach to the Heterogeneous Chemistry, Wiley, New York, 1989, p. 133; P. Meakin and J.M. Deutch, J. Chem. Phys., 80 (1984) 2115.
    • (1984) J. Chem. Phys. , vol.80 , pp. 2115
    • Meakin, P.1    Deutch, J.M.2
  • 22


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.