Characterization of polymer-layered silicate (clay) nanocomposites by transmission electron microscopy and X-ray diffraction: A comparative study

Journal of Applied Polymer Science

Volumn 87, Issue 8, 2002, Pages 1329-1338

  Morgan, Alexander B ^a   Gilman, Jeffrey W ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Nanocomposites; TEM; WAXS

Indexed keywords

CHARACTERIZATION; MORPHOLOGY; SILICATE MINERALS; THERMOPLASTICS; THERMOSETS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CYANATE ESTERS; NANOSCALE DISPERSION; POLYMER LAYERED SILICATE NANOCOMPOSITES; POLYPROPYLENE MALEIC ANHYDRIDE; POLYSTYRENE NYLON; WIDE ANGLE X RAY DIFFRACTION;

NANOSTRUCTURED MATERIALS;

NANOCOMPOSITE;

EID: 0037155307     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/app.11884     Document Type: Article

References (38)

1. Giannelis, E. P. Adv Mater 1996, 8, 29.
2. Wang, Z.; Pinnavaia, T. J Chem Mater 1998, 10, 1820.
3. Burnside, S. D.; Giannelis, E. P. Chem Mater 1995, 7, 1597.
4. Alexandre, M.; Dubois, P. Mater Sci Eng 2000, 28, 1.
5. Gilman, J. W. Appl Clay Sci 1999, 15, 31.
6. Gilman, J. W.; Kashiwagi, T.; Nyden, M.; Brown, J. E. T.; Jackson, C. L.; Lomakin, S.; Giannelis, E. P.; Manias, E. Chemistry and Technology of Polymer Additives; Royal Society of Chemistry: Cambridge, England, 1999; p 249.
7. Gilman, J. W.; Jackson, C. L.; Morgan, A. B.; Harris, R., Jr.; Manias, E.; Giannelis, E. P.; Wuthenow, M.; Hilton, D.; Phillips, S. H. Chem Mater 2000, 12, 1866.
8. Gunter, M.; Reichert, P.; Mülhaupt, R.; Gronski, W. Polym Mater Sci Eng 2000, 82, 228.
9. Davis, R. D.; Jarrett, W. L.; Mathias, L. J. Polym Mater Sci Eng 2000, 82, 272.
10. VanderHart, D. L.; Asano, A.; Gilman, J. W. Chem Mater 2001, 13, 3781.
11. VanderHart, D. L.; Asano, A.; Gilman, J. W. Chem Mater 2001, 13, 3796.
12. Krishnamoorti, R.; Vaia, R. A.; Giannelis, E. P. Chem Mater 1996, 8, 1728.
13. Giannelis, E. P.; Burnside, S. D. J Polym Sci Part B: Polym Phys 2000, 38, 1594.
14. Huang, X.; Lewis, S.; Brittain, W. J.; Vaia, R. A. Macromolecules 2000, 33, 2000.
15. Reichert, P.; Nitz, H.; Klinke, S.; Brandsch, R.; Thomann, R.; Mülhaupt, R. Macromol Mater Eng 2000, 275, 8.
16. Vaia, R. A.; Jandt, K. A.; Krammer, E. J.; Giannelis, E. P. Chem Mater 1996, 8, 2628.
17. Müller, U. Inorganic Structural Chemistry; Wiley: New York, 1992; p 173.
18. Ginzburg, V. V.; Singh, C.; Balazs, A. C. Macromolecules 2000, 33, 1089.
19. Xie, W.; Gao, Z.; Pan, W.-P.; Hunter, D.; Singh, A.; Vaia, R. Chem Mater 2001, 13, 2979.
20. Pauly, T. R.; Pinnavaia, T. J Chem Mater 2001, 13, 987.
21. Kruk, M.; Jaroniec, M.; Sayari, A. J Phys Chem B 1999, 103, 4590.
22. Dennis, H. R.; Hunter, D. L.; Chang, D.; Kim, S.; White, J. L.; Cho, J. W.; Paul, D. R. Soc Plast Eng Annu Tech Conf 2000, 1, 428.
23. Chen, G.; Qi, Z.; Shen, D. J Mater Res 2000, 15, 351.
24. Okamoto, M.; Morita, S.; Taguchi, H.; Kim, Y. H.; Kotaka, T.; Tateyam, H. Polymer 2000, 41, 3887.
25. Morgan, A. B.; Gilman, J. W.; Jackson, C. L. Macromolecules 2001, 34, 2735.
26. Morgan, A. B.; Gilman, J. W.; Jackson, C. L. Polym Mater Sci Eng 2000, 82, 270.
27. Lee, J.; Takekoshi, T.; Giannelis, E. Mater Res Soc Symp Proc 1997, 457, 513.
28. Ishida, H.; Campbell, S.; Blackwell, J Chem Mater 2000, 12. 1260.
29. Vaia, R. A.; Weathers, M. S.; Bassett, W. A. Powder Diffraction 1994, 9, 44.
30. Morgan, A. B.; Gilman, J. W.; Nyden, M.; Jackson, C. L. National Institute of Standards and Technology Internal Report 6465; National Institute of Standards and Technology: Gaithersburg, MD, 2000.
31. Gilman, J. W.; Harris, R. H.; Hunter, D. Presented at the 44th International SAMPE Symposium and Exhibition, Long Beach, CA, May 1999.
32. Zhu, J.; Morgan, A. B.; Lamellas, F.; Wilkie, C. A. Chem Mater, 2001, 13, 4649.
33. Kojima, Y.; Usuki, A.; Kawasumi, M.; Okada, A.; Fukushima, Y.; Kurauchi, T.; Kamigaito, O. J Mater Res 1993, 8, 1185.
34. Reynolds, R. C. Jr. Diffraction by Small and Disordered Crystals in Modern Powder Diffraction; Reviews in Mineralogy Vol. 20; Mineralogical Society of America: Washington, DC, 1989; p 144.
35. Klug, H. P.; Alexander, L. E. Diffraction Procedures; Wiley: New York, 1974.
36. Brown, J. M.; Curliss, D.; Vaia, R. A. Chem Mater 2000, 12, 3376.
37. Vaia, R. A.; Lincoln, D.; Wang, Z.-G.; Hsiao, B. S. Polym Mater Sci Eng 2000, 82, 257.
38. Gilman, J. W.; Kashiwagi, T.; Morgan, A. B.; Harris, R. H.; Brassel, L. D.; VanLandingham, M.; Jackson, C. L. National Institute of Standards and Technology Internal Report 6531; National Institute of Standards and Technology: Gaithersburg, MD, 2000.