A neural network approach to real-time dielectric characterization of materials

Microwave and Optical Technology Letters

Volumn 35, Issue 6, 2002, Pages 463-465

  Olmi, R ^a   Pelosi, G ^b   Riminesi, C ^b   Tedesco, M ^a  

^a IFAC CNR   (Italy)

^b UNIVERSITY OF FLORENCE   (Italy)

Author keywords

Artificial neural networks; Complex permittivity; Waveguide measurement

Indexed keywords

APPROXIMATION THEORY; COMPUTATIONAL METHODS; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE POLARIZATION; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE TRANSMISSION; GENETIC ALGORITHMS; NEURAL NETWORKS; PERMITTIVITY; POLYNOMIALS; SHORT CIRCUIT CURRENTS; WAVEGUIDES;

COMPLEX PERMITTIVITY; ELECTROMAGNETIC MODEL; POLYNOMIAL INTERPOLATOR; WAVEGUIDE MEASUREMENT;

MICROWAVE MEASUREMENT;

EID: 0037147415     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.10639     Document Type: Article

References (7)

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