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Volumn 11, Issue 11, 2000, Pages 1623-1629
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Non-destructive permittivity measurement of solid materials
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS;
ELECTRIC NETWORK ANALYSIS;
GENETIC ALGORITHMS;
MICROWAVE MEASUREMENT;
PROBES;
COAXIAL PROBES;
SOLID MATERIALS;
PERMITTIVITY MEASUREMENT;
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EID: 0034321079
PISSN: 09570233
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-0233/11/11/312 Document Type: Article |
Times cited : (37)
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References (14)
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