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Volumn 422, Issue 1-2, 2002, Pages 73-79

Characterization of epitaxial thin films of Bi2VO5.5 on La-doped SrTiO3 substrates prepared by coating-pyrolysis process

Author keywords

Bi2VO5.5; Epitaxial thin films; La doped SrTiO3

Indexed keywords

ANISOTROPY; ANNEALING; ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; DOPING (ADDITIVES); EPITAXIAL GROWTH; PYROLYSIS; STRONTIUM COMPOUNDS;

EID: 0037147229     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00984-7     Document Type: Article
Times cited : (5)

References (16)
  • 7
    • 0012148398 scopus 로고    scopus 로고
    • Powder Diffraction File, Card 42-0135, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 1998
    • Powder Diffraction File, Card 42-0135, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 1998.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.