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Volumn 347, Issue 1-2, 2002, Pages 131-140
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New stacking variants Y5Ni8B8C5 and Y5Ni6B6C5
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Author keywords
Crystal structure; Rare earth compounds; Transition metal compounds; Transmission electron microscopy (TEM); X ray diffraction
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Indexed keywords
ANNEALING;
CRYSTAL STRUCTURE;
ELECTRON DIFFRACTION;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
STACKING FAULTS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
STOICHIOMETRIC COMPOSITIONS;
YTTRIUM ALLOYS;
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EID: 0037121683
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(02)00771-5 Document Type: Article |
Times cited : (7)
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References (19)
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