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Volumn 34, Issue 9, 1999, Pages 1213-1220

TEM investigation of stacking faults in the superconducting compound YNi2B2C

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; HIGH TEMPERATURE EFFECTS; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; STACKING FAULTS; STOICHIOMETRY; SUPERCONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

EID: 18344406827     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4079(199911)34:9<1213::AID-CRAT1213>3.0.CO;2-K     Document Type: Article
Times cited : (7)

References (16)
  • 1
    • 0003039532 scopus 로고
    • The study of planar interfaces by means of electron microscopy
    • North-Holland Publishing Company. Eds. S. Amelinckx, R. Gevers, J. VanLanduyt
    • AMELINCKX, S., VANLANDUYT, J.: The study of planar interfaces by means of electron microscopy, North-Holland Publishing Company. 1978. Diffraction and Imaging Techniques in Material Science, Eds. S. Amelinckx, R. Gevers, J. VanLanduyt
    • (1978) Diffraction and Imaging Techniques in Material Science
    • Amelinckx, S.1    VanLanduyt, J.2
  • 4
    • 0343587346 scopus 로고    scopus 로고
    • Diploma thesis, TU Dresden
    • BELGER, A.: Diploma thesis, TU Dresden, 1997
    • (1997)
    • Belger, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.