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Volumn 92, Issue 12, 2002, Pages 7128-7132

Electrochromic properties of SnO2-incorporated Ni oxide films grown using a cosputtering system

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; ELECTROCHROMISM; NICKEL; PLASMA HEATING; SCANNING ELECTRON MICROSCOPY; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

COSPUTTERING;

THIN FILMS;

EID: 0037115444 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1521519 Document Type: Article

Times cited : (14)

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