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Volumn 92, Issue 10, 2002, Pages 5735-5739
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Optical constants of methyl-pentaphenylsilole by spectroscopic ellipsometry
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND EDGE;
EXTINCTION COEFFICIENTS;
LORENTZ MODEL;
SELLMEIER EQUATION;
SILICON SUBSTRATES;
SPECTRAL RANGE;
UV ABSORPTION;
WAVELENGTH RANGES;
AMORPHOUS SEMICONDUCTORS;
OPTICAL CONSTANTS;
REFRACTIVE INDEX;
SEMICONDUCTOR DEVICE MODELS;
SPECTROSCOPIC ELLIPSOMETRY;
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EID: 0037113085
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1512312 Document Type: Article |
Times cited : (22)
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References (13)
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