SCOPUS 정보 검색 플랫폼

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 III, 2001, Pages 3158-3161

Influence of film thickness on the critical current of YBa2Cu3O7-x thick films on Ni-V biaxially textured substrates

(9) Boffa, V a Celentano, G b Ciontea, L c Fabbri, F b Galluzzi, V b Gambardella, U d Grimaldi, G e Mancini, A b Petrisor, T c

a Pirelli Labs SpA (Italy)

b ENEA (Italy)

c TECHNICAL UNIVERSITY OF CLUJ NAPOCA (Romania)

d INFN LABORATORI NAZIONALI DI FRASCATI (Italy)

e UNIVERSITY OF SALERNO (Italy)

Author keywords

Critical current; High temperature superconductors; Thick film

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL STRUCTURE; MAGNETIC FIELD EFFECTS; MORPHOLOGY; SUBSTRATES; SUPERCONDUCTING FILMS; TEXTURES; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

COATED CONDUCTORS; STRUCTURAL DETERIORATION;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0035269177 PISSN: 10518223 EISSN: None Source Type: Journal
DOI: 10.1109/77.919733 Document Type: Conference Paper

Times cited : (9)

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