Resonant optical microcavity based on crystalline silicon active layer

Journal of Applied Physics

Volumn 92, Issue 4, 2002, Pages 2207-2209

  Sotta, D ^a   Hadji, E ^a   Magnea, N ^a   Delamadeleine, E ^a   Besson, P ^b   Renard, P ^a   Moriceau, H ^a  

^a CEA GRENOBLE   (France)

^b STMICROELECTRONICS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; ANGLE-DEPENDENT; CONDENSED PHASE; CRYSTALLINE SILICONS; DIELECTRIC MIRRORS; ELECTRON HOLE; LOW TEMPERATURE PHOTOLUMINESCENCE; OPTICAL MICROCAVITIES; PL SPECTRA; PL SPECTROSCOPY; SILICON DIOXIDE LAYERS; SILICON-ON-INSULATOR SUBSTRATES; SINGLE-CRYSTALLINE; SUBMICRON;

CRYSTALLINE MATERIALS; MICROCAVITIES; OPTICAL PROPERTIES; SILICON ON INSULATOR TECHNOLOGY;

SILICON;

EID: 0037103689     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1494841     Document Type: Article

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