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Volumn 85, Issue 7, 2002, Pages 1553-1561

Characterization of biaxially oriented polypropylene films by atomic force microscopy and microthermal analysis

Author keywords

Atomic force microscopy; Polypropylene films; Thermal properties

Indexed keywords

POLYPROPYLENE FILMS;

EID: 0037102824     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/app.10787     Document Type: Article
Times cited : (12)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.