Multifractal analysis and scaling range of ZnO AFM images

Physica A: Statistical Mechanics and its Applications

Volumn 311, Issue 3-4, 2002, Pages 327-338

  Sun, Xia ^a   Fu, Zhuxi ^a   Wu, Ziqin ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

AFM images; Multifractal; Scaling range

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; FRACTALS; SPUTTERING; SURFACE TOPOGRAPHY; THIN FILMS;

MULTIFRACTAL ANALYSIS;

ZINC OXIDE;

EID: 0037102671     PISSN: 03784371     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-4371(02)00820-8     Document Type: Article

References (14)