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Volumn 41, Issue 6 B, 2002, Pages
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Energy-filtered reflection high-energy electron diffraction apparatus combined with energy-loss measurement system
a
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Author keywords
Energy filter; Energy loss; Inelastic scattering; RHEED; Si(111)7 7; Surface plasmon
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Indexed keywords
CRYSTALLOGRAPHY;
ELECTRIC LOSSES;
HIGH PASS FILTERS;
MORPHOLOGY;
SIGNAL TO NOISE RATIO;
SURFACE PLASMON RESONANCE;
SURFACE STRUCTURE;
SURFACE TREATMENT;
ELASTIC SCATTERING;
ENERGY FILTER;
INELASTIC SCATTERING;
SURFACE PLASMON ENERGY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
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EID: 0037098661
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.41.l736 Document Type: Letter |
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Times cited : (8)
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References (10)
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