Inelastic scattering components in the Si(111)-(7 × 7) rheed pattern by the energy filtering method

Surface Review and Letters

Volumn 5, Issue 3-4, 1998, Pages 755-760

  Horio, Y ^a   Urakami, Y ^b   Hashimoto, Y ^b  

^a DAIDO UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032353434     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x98001134     Document Type: Article

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