Growth of ferromagnetic semiconducting cobalt-doped anatase titanium thin films

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 7914-7916

  Shim, In Bo ^a   An, Sung Yong ^a   Kim, Chul Sung ^a   Choi, Se Young ^b   Park, Yong Wook ^c  

^a Kookmin University   (South Korea)

^b Yonsei University   (South Korea)

^c Namseoul University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CHEMICAL PROCESSING; CRYSTAL QUALITIES; CRYSTALLINITIES; FERROMAGNETIC STRUCTURES; HETEROEPITAXIAL; HIGH VACUUM; IMPURITY PHASE; MICRO-STRUCTURAL CHARACTERIZATION; POLYCRYSTALLINE; ROCKING CURVES; SOFT CHEMICAL PROCESS; THERMALLY OXIDIZED SILICON; TITANIUM THIN FILMS; XRD PATTERNS;

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; FERROMAGNETIC MATERIALS; FERROMAGNETISM; LANTHANUM ALLOYS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; SEMICONDUCTOR GROWTH; SILICON OXIDES; SURFACE ROUGHNESS; THIN FILMS; TITANIUM; TITANIUM DIOXIDE; X RAY DIFFRACTION;

COBALT;

EID: 0037094865     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1451880     Document Type: Article

References (4)

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