Dielectric relaxation of WO 3 thick films from 10 Hz to 1.8 GHz

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 6775-6777

  Schmitt, R ^a   McCann, D ^a   Marquis, B ^a   Kotecki, D E ^b  

^a Sensor Research and Development Corporation   (United States)

^b University of Maine   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1.8 GHZ; DIELECTRIC RESPONSE; FREQUENCY DOMAINS; FREQUENCY RANGES; IMPEDANCE MEASUREMENT; MEASUREMENT TECHNIQUES; PERMITTIVITY AND LOSS; REFLECTION COEFFICIENT MEASUREMENT; TIME DOMAIN;

DIELECTRIC RELAXATION; DISPERSIONS; FREQUENCY DOMAIN ANALYSIS; THICK FILMS;

TIME DOMAIN ANALYSIS;

EID: 0037094828     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1468276     Document Type: Article

References (7)

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