SCOPUS 정보 검색 플랫폼

Volumn 65, Issue 16, 2002, Pages 1653191-1653198

Model of schottky junction admittance taking into account incomplete impurity ionization and large-signal effects

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; IONIZATION; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; TEMPERATURE;

EID: 0037091639 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (3)

References (23)

3
- 33744604456
- Sov. Phys. JETP 11, 6 (1960)
- (1960) Zh. Eksp. Teor. Fiz. , vol.38 , pp. 10
- Vul, B.M.¹ Zavaritskaya, E.I.²

9
- 33744689781
- Sov. Phys. Dokl. 4, 1246 (1960)
- (1959) Dokl. Akad. Nauk SSSR , vol.129 , pp. 61
- Vul, B.M.¹

10
- 0014749855
- (1970) J. Appl. Phys. , vol.41 , pp. 1767
- Roberts, G.I.¹ Crowell, C.R.²

11
- 33748621800
- (1952) Phys. Rev. , vol.87 , pp. 835
- Shockley, W.¹ Read W.T., Jr.²

13
- 33744661393
- Sov. Phys. Semiconductors 1, 1403 (1968)
- (1967) Fiz. Tekh. Poluprovod , vol.1 , pp. 1963
- Perel, V.I.¹ Efros, A.L.²

16
- 33744563238
- (1964) C R. Acad. Sci. , vol.258 , pp. 1749
- Frandon, P.¹ Hoffmann, J.-C.²

17
- 33744567309
- (1964) C R. Acad. Sci. , vol.258 , pp. 5371
- Frandon, P.¹ Hoffmann, J.-C.²

18
- 33744687435
- (1964) C R. Acad. Sci. , vol.259 , pp. 2377
- Frandon, P.¹ Hoffmann, J.-C.²

19
- 33744619097
- Hewlett Packard HP4280A C Meter/C-V plotter operation and service manual

23
- 0035310069
- (2001) J. Appl. Phys. , vol.89 , pp. 3999
- Los, A.V.¹ Mazzola, M.S.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.