Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system

TMS Annual Meeting

Volumn , Issue , 1998, Pages 83-90

  Rozdilsky, Ian ^a   Cerezo, Alfred ^a   Smith, G D W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH; DIFFUSION IN SOLIDS; INTERFACES (MATERIALS); PRECIPITATION (CHEMICAL); PROBES;

CRYSTAL COARSENING;

COPPER ALLOYS;

EID: 0031678312     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)