Novel Josephson junction geometries in NbCu bilayers fabricated by focused ion beam microscope

Physica C: Superconductivity and its Applications

Volumn 367, Issue 1-4, 2002, Pages 267-271

  Hadfield, R H ^a   Burnell, G ^a   Grimes, P K ^a   Kang, D J ^a   Blamire, M G ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Josephson devices; Josephson effects; Superconducting junctions

Indexed keywords

CRITICAL CURRENTS; CURRENT VOLTAGE CHARACTERISTICS; ION BEAMS; MAGNETIC FIELD EFFECTS; NIOBIUM COMPOUNDS; SUPERCONDUCTING FILMS;

ION BEAM MICROSCOPES;

JOSEPHSON JUNCTION DEVICES;

EID: 0037082802     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)01049-8     Document Type: Article

References (6)

1. c superconductor-normal metal-superconductor junctions using a focused ion beam
2. Nanoscale SNS junction fabrication in superconductor-normal metal bilayers
3. Real time resistometric depth monitoring in the focused ion beam
4. c Josephson junctions produced by focused electron beam irradiation