SCOPUS 정보 검색 플랫폼

Acta Materialia

Volumn 50, Issue 5, 2002, Pages 1219-1227

An experimental study of the influence of imperfections on the buckling of compressed thin films

(6) Moon, M W a,d Chung, J W b Lee, K R b Oh, K H a Wang, R c Evans, A G d

a Seoul National University (South Korea)

b Korea Institute of Science and Technology (South Korea)

c UNIVERSITY OF BRITISH COLUMBIA (Canada)

d Princeton University (United States)

Author keywords

Buckle driven delamination; Coating; Defect; FIB; Interface separation

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; BUCKLING; COMPRESSION TESTING; CRACK INITIATION; CRACK PROPAGATION; DELAMINATION; IMAGING SYSTEMS; INTERFACES (MATERIALS); ION BEAMS; THIN FILMS;

FOCUSED ION BEAMS (FIB);

DIAMOND LIKE CARBON FILMS;

EID: 0037075750 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6454(01)00423-2 Document Type: Article

Times cited : (112)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.