Use of multiple-edge refinement of extended x-ray absorption fine structure to determine site occupancy in mixed ferrite nanoparticles

Applied Physics Letters

Volumn 81, Issue 20, 2002, Pages 3828-3830

  Calvin, S ^a   Carpenter, E E ^a   Harris, V G ^a   Morrison, S A ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b GEORGE WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; MICELLES; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; X RAY ANALYSIS;

CURIE TEMPERATURE;

FERRITES;

EID: 0037065046     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1520700     Document Type: Article

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