Cation distribution in NiZn-ferrite films via extended x-ray absorption fine structure

Applied Physics Letters

Volumn 68, Issue 15, 1996, Pages 2082-2084

  Harris, V G ^a   Koon, N C ^a   Williams, C M ^b   Zhang, Q ^c   Abe, M ^c   Kirkland, J P ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b MORGAN STATE UNIVERSITY   (United States)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^d SFA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000282095     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115591     Document Type: Article

References (12)

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7. Handbook of Microwave Ferrite Materials, edited by W. E. von Aulock (Academic, New York, 1965), pp. 379-393.
8. D. E. Sayers and B. A. Bunker, in X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS, and XANES, edited by D. C. Koningsberger and R. Prins (Wiley, New York, 1988).
9. J. J. Rehr, J. Mustre de Leon, S. I. Zabinsky, and R. C. Albers, J. Amer. Chem. Soc. 113, 5135 (1991); J. J. Rehr, S. I. Zabinsky, and R. C. Albers, Phys. Rev. Lett. 69, 3397 (1992).
10. V. G. Harris, N. C. Koon, C. M. Williams, Q. Zhang, M. Abe, J. P. Kirkland, and D. A. McKeown, IEEE Trans. Magn. 31, 3473 (1995).
11. 0.
12. Error bars were determined by merging several individual data scans after normalization and conversion to photoelectron wave vector space thus allowing the determination of a mean and standard deviation which reflects both the data collection statistics and the uncertainty introduced to the data by the background removal procedure.