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Volumn 81, Issue 20, 2002, Pages 3867-3869

Generalized electron emission model for field, thermal, and photoemission

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; ELECTRON EMISSION; ELECTRON TRANSPORT PROPERTIES; INTEGRATION; PARAMETER ESTIMATION; PERMITTIVITY; PHOTOCATHODES; THERMIONIC EMISSION;

EID: 0037064985     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1521491     Document Type: Article
Times cited : (43)

References (12)
  • 5
    • 0011995953 scopus 로고    scopus 로고
    • edited by W. Zhu (Wiley, New York), Chap. 3
    • K.L. Jensen, in Vacuum Microelectronics, edited by W. Zhu (Wiley, New York, 2001), Chap. 3.
    • (2001) Vacuum Microelectronics
    • Jensen, K.L.1
  • 11
    • 0011955545 scopus 로고
    • D. Bohm and B.J. Hiley, Nuovo Cimento 52, 246 (1979); see also D. Bohm and B.J. Hiley, Phys. Rev. Lett. 55, 2511 (1985). The "constant current" condition discussed herein is obtainable from their Eq. (2).
    • (1979) Nuovo Cimento , vol.52 , pp. 246
    • Bohm, D.1    Hiley, B.J.2
  • 12
    • 0012869652 scopus 로고
    • The "constant current" condition discussed herein is obtainable from their Eq. (2)
    • D. Bohm and B.J. Hiley, Nuovo Cimento 52, 246 (1979); see also D. Bohm and B.J. Hiley, Phys. Rev. Lett. 55, 2511 (1985). The "constant current" condition discussed herein is obtainable from their Eq. (2).
    • (1985) Phys. Rev. Lett. , vol.55 , pp. 2511
    • Bohm, D.1    Hiley, B.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.