Structural analysis of a high-pressure amorphous phase of SnI4

Journal of Physics Condensed Matter

Volumn 14, Issue 44 SPEC ISS., 2002, Pages 10553-10556

  Ohmura, A ^a   Hamaya, N ^a   Sato, K ^b   Ogawa, C ^a   Isshiki, M ^c   Ohishi, Y ^c  

^a OCHANOMIZU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; HIGH PRESSURE EFFECTS; METALLIC GLASS; Q FACTOR MEASUREMENT; STRUCTURE (COMPOSITION); X RAY DIFFRACTION ANALYSIS;

FABER - ZIMAN STRUCTURE FACTOR S; HIGH PRESSURE SYNCHROTRON X RAY DIFFRACTION; MOLECULAR LIQUIDS; TIN IODINE COMPOUNDS;

SEMICONDUCTING TIN COMPOUNDS;

EID: 0037064889     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/44/331     Document Type: Article

References (9)

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9. Sato K 1999 PhD Thesis Ochanomizu University