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Volumn 14, Issue 44 SPEC ISS., 2002, Pages 10545-10551
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Charge density analysis of SiO2 under pressures over 50 GPa using a new diamond anvil cell for single-crystal structure analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
COULOMB BLOCKADE;
CRYSTAL STRUCTURE;
CURRENT DENSITY;
ELECTRIC CHARGE;
ELECTROLYTIC CELLS;
ELECTRONIC DENSITY OF STATES;
HIGH PRESSURE EFFECTS;
PHASE TRANSITIONS;
Q FACTOR MEASUREMENT;
SINGLE CRYSTALS;
SYNCHROTRON RADIATION;
X RAY CRYSTALLOGRAPHY;
CHARGE DENSITY ANALYSIS;
COULOMB POTENTIAL;
DIAMOND ANVIL CELL;
INTERATOMIC FORCE;
PRESSURE INDUCED TRANSFORMATION;
SINGLE CRYSTAL STRUCTURE ANALYSIS;
SILICA;
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EID: 0037064714
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/14/44/330 Document Type: Article |
Times cited : (10)
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References (13)
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