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Volumn 14, Issue 44 SPEC ISS., 2002, Pages 10545-10551

Charge density analysis of SiO2 under pressures over 50 GPa using a new diamond anvil cell for single-crystal structure analysis

Author keywords

[No Author keywords available]

Indexed keywords

COULOMB BLOCKADE; CRYSTAL STRUCTURE; CURRENT DENSITY; ELECTRIC CHARGE; ELECTROLYTIC CELLS; ELECTRONIC DENSITY OF STATES; HIGH PRESSURE EFFECTS; PHASE TRANSITIONS; Q FACTOR MEASUREMENT; SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY CRYSTALLOGRAPHY;

EID: 0037064714     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/44/330     Document Type: Article
Times cited : (10)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.