Atomic force microscope study of the rejection of colloids by membrane pores

Desalination

Volumn 150, Issue 3, 2002, Pages 289-295

  Hilal, Nidal ^a   Bowen, W Richard ^b  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Atomic force microscopy; Colloid probe; Electrical double layer; Membrane; Microfiltration; Surface forces

Indexed keywords

ATOMIC FORCE MICROSCOPY; COLLOIDS; IMAGE QUALITY; MICROFILTRATION; PH EFFECTS; SCANNING; SILICA;

TRACK ETCH;

DESALINATION;

ATOMIC FORCE MICROSCOPY; COLLOID; MEMBRANE; MICROFILTRATION;

EID: 0037058379     PISSN: 00119164     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-9164(02)00985-2     Document Type: Article

References (22)

1. Atomic force microscopy-special issue
2. Surface chemistry and electrochemistry of membrane surfaces
3. Electrochemical aspects of microfiltration and ultrafiltration