Development and application of a combined atomic force microscopy-nanoindentation system with a silicon tip and a diamond indenter

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 82, Issue 10, 2002, Pages 2149-2160

  Miyahara, K ^a   Nagashima, N ^a   Matsuoka, S ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBIDES; GLASS; HARDNESS TESTING; IMAGE QUALITY; MICROSTRUCTURE; NICKEL; SCANNING; SILICON; STEEL; SYNTHETIC DIAMONDS; TUNGSTEN;

ATOMIC FORCE MICROSCOPY NANOINDENTATION SYSTEM; DIAMOND INDENTER; INDENTATION TESTING; MARTENSITIC STEEL; SILICON TIP;

INDENTATION;

EID: 0037055321     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610208235724     Document Type: Article

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