Process capability indices for a regularly adjusted process

International Journal of Production Research

Volumn 40, Issue 10, 2002, Pages 2367-2377

  Xie, M ^a   Tsui, K L ^b   Goh, T N ^a   Cai, D Q ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURING DATA PROCESSING; PRODUCTION CONTROL; QUALITY CONTROL; RANDOM PROCESSES;

PROCESS CAPABILITY; PROCESS VARIATION; RANDOM VARIATION;

STATISTICAL PROCESS CONTROL;

EID: 0037054909     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540210133543     Document Type: Article

References (19)

1. From trend charts to control charts-setup tests for making the leap
2. Application of non-normal process capability indices to semiconductor quality control
3. Implementation of statistical process control and process capability studies: Requirements or free will?
4. Re-evaluating the process capability indices for non-normal distributions
5. On the gap between theory and practice of process capability studies
6. Impact of mixture distributions in classical process capability analysis
7. Some practical issues in the assessment of nonconforming rates in a manufacturing process
8. Process capability studies, Part I-V
9. Statistical process control of an industrial process in real time
10. Process capability indices
11. A review and interpretations of process capability indices
12. Making decisions in assessing process capability index
13. A new approach to analysing non-normal quality data with application to process capability analysis
14. Assessing process capability in the presence of systematic assignable cause
15. A statistical approach to real-time quality control
16. Process capability indices for skewed process data
17. On the monitoring of trended and regularly adjusted processes