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Volumn 506, Issue 1-2, 2002, Pages
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In situ variable temperature atomic force microscopy measurements of copper growth on MgO(1 0 0)
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Author keywords
Atomic force microscopy; Copper; Growth; Magnesium oxides; Metal insulator interfaces; Nucleation; Surface diffusion
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COALESCENCE;
COPPER;
DIFFUSION;
GROWTH (MATERIALS);
HIGH TEMPERATURE EFFECTS;
IMAGING TECHNIQUES;
MAGNESIUM COMPOUNDS;
MONOLAYERS;
NUCLEATION;
PHASE INTERFACES;
THERMODYNAMIC STABILITY;
SURFACE DIFFUSION;
SURFACE REACTIONS;
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EID: 0037052797
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01819-2 Document Type: Article |
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Times cited : (12)
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References (14)
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