Two-stage control charts for high yield processes

International Journal of Reliability, Quality and Safety Engineering

Volumn 4, Issue 2, 1997, Pages 149-165

  Chan, L Y ^a   Xie, M ^b   Goh, T N ^b  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Control limits; Cumulative count of conforming chart; High yield processes; Statistical process control; Two stage control chart

Indexed keywords

EID: 0000649618     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539397000114     Document Type: Article

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