Hydrogen sensing characteristics Cu-PS-Si structures

Journal of Physics D: Applied Physics

Volumn 35, Issue 23, 2002, Pages 3122-3126

  Dzhafarov, T D ^a,c   Can Omur, B ^a   Oruc, C ^a   Allahverdiev, Z A ^b  

^a YILDIZ TECHNICAL UNIVERSITY   (Turkey)

^b KARADENIZ TECHNICAL UNIVERSITY   (Turkey)

^c INSTITUTE OF PHYSICS   (Azerbaijan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER; CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION IN SOLIDS; HYDROGEN; OXIDATION; THERMAL EFFECTS; VAPORS;

HUMID VOLTAGE; HYDROGEN SENSING;

POROUS SILICON;

EID: 0037039068     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/23/313     Document Type: Article

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