A terahertz system using semi-large emitters: Noise and performance characteristics

Physics in Medicine and Biology

Volumn 47, Issue 21, 2002, Pages 3699-3704

  Zhao, G ^a   Schouten, R N ^a   van der Valk, N ^a   Wenckebach, W Th ^a   Planken, P C M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; ELECTRODES; ELECTROMAGNETIC WAVES; ELECTROOPTICAL EFFECTS; LASERS; PERFORMANCE; SEMICONDUCTOR MATERIALS;

MICROFABRICATION TECHNIQUES; TERAHERTZ DETECTION;

BIOTECHNOLOGY;

ARTICLE; CONTROLLED STUDY; CRYSTAL; DIAGNOSTIC IMAGING; ELECTRODE; ELECTROMAGNETIC RADIATION; ELECTRONIC SENSOR; FIELD EMISSION; HIGH TEMPERATURE; IMAGING SYSTEM; MEDICAL TECHNOLOGY; OSCILLATOR; PRIORITY JOURNAL; SIGNAL NOISE RATIO; STANDARDIZATION; TERAHERTZ RADIATION; CHEMISTRY; CRYSTALLIZATION; CRYSTALLOGRAPHY; ELECTROMAGNETIC FIELD; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; LASER; MATERIALS TESTING; METHODOLOGY; MICROWAVE RADIATION; OPTICS; PHOTOSTIMULATION; QUALITY CONTROL; SEMICONDUCTOR; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; STATISTICS; TRANSDUCER;

GALLIUM; GALLIUM ARSENIDE; ORGANOARSENIC DERIVATIVE; TELLURIUM; ZINC DERIVATIVE;

ARSENICALS; CRYSTALLIZATION; CRYSTALLOGRAPHY; ELECTROMAGNETICS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GALLIUM; LASERS; MATERIALS TESTING; MICROWAVES; OPTICS; PHOTIC STIMULATION; QUALITY CONTROL; SEMICONDUCTORS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS; STOCHASTIC PROCESSES; TELLURIUM; TRANSDUCERS; ZINC COMPOUNDS;

EID: 0037038497     PISSN: 00319155     EISSN: None     Source Type: Journal    
DOI: 10.1088/0031-9155/47/21/304     Document Type: Article

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