Comparative analysis of Ti3SiC2 and associated compounds using x-ray diffraction and x-ray photoelectron spectroscopy

Journal of Physics D: Applied Physics

Volumn 35, Issue 13, 2002, Pages 1603-1611

  Riley, D P ^a   O'Connor, D J ^a   Dastoor, P ^a   Brack, N ^b   Pigram, P J ^b  

^a UNIVERSITY OF NEWCASTLE   (Australia)

^b LA TROBE UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ETCHING; OXIDATION; OXIDES; THERMAL CONDUCTIVITY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ASSOCIATED COMPOUNDS; BOND CHEMISTRIES;

TITANIUM COMPOUNDS;

EID: 0037036570     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/13/324     Document Type: Article

References (30)

1. The refractory carbides
2. Ti within (TiC)
3. Ti within (TiC)
4. Ti within (TiC)
5. 2)
6. 2)
7. C within (TiC)
8. C within (TiC)
9. C within (TiC)