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The XRD patterns were recorded using Rigaku MaltiFlex Cu Kα radiation (40 kV, 40 mA) by scanning at 1° (2θ)/min. The crystallite size was calculated from the half-height width of the (101) diffraction peak of anatase phase using the Debye-Scherrer equation: λ = 0.154056 nm and the shape factor, K = 0.9.
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The XRD patterns were recorded using Rigaku MaltiFlex Cu Kα radiation (40 kV, 40 mA) by scanning at 1° (2θ)/min. The crystallite size was calculated from the half-height width of the (101) diffraction peak of anatase phase using the Debye-Scherrer equation: λ = 0.154056 nm and the shape factor, K = 0.9.
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