The use of atomic force microscopy to quantify membrane surface electrical properties

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 201, Issue 1-3, 2002, Pages 73-83

  Bowen, W Richard ^a   Doneva, Teodora A ^a   Stoton, J Austin G ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Atomic force microscopy; Desal nanofiltration membrane; Theoretical calculations

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ELECTROLYTES; FOULING; IONIC STRENGTH; NANOFILTRATION; NONLINEAR EQUATIONS; POISSON EQUATION; SILICA; SURFACE ROUGHNESS;

ELECTRICAL DOUBLE LAYER INTERACTIONS;

COLLOIDS;

ELECTROLYTE; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRICITY; IONIC STRENGTH; MATHEMATICAL COMPUTING; MEMBRANE; NANOFILTRATION; PRIORITY JOURNAL; SURFACE CHARGE; SURFACE PROPERTY; ZETA POTENTIAL;

EID: 0037022774     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(01)00790-7     Document Type: Article

References (30)