Variation of Raman feature on excitation wavelength in silicon nanowires

Applied Physics Letters

Volumn 81, Issue 23, 2002, Pages 4446-4448

  Zhang, Shu Lin ^a   Ding, Wei ^a   Yan, Yan ^a   Qu, Jiang ^a   Li, Bibo ^a   Li, Le Yu ^a   Yue, Kwok To ^a   Yu, Dapeng ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRON TRANSITIONS; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; RAMAN SCATTERING;

QUANTUM SIZE CONFINEMENT EFFECTS;

SILICON;

EID: 0037011479     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1527228     Document Type: Article

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