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Applied Physics A: Materials Science and Processing

Volumn 74, Issue SUPPL.II, 2002, Pages

Polarised neutron reflectometry study of Co/CoO exchange-biased multilayers

(7) Radu, F a,b Etzkorn, M a Leiner, V a,c Schmitte, T a Schreyer, A a Westerholt, K a Zabel, H a

a RUHR UNIVERSITY BOCHUM (Germany)

b Dept de Fizica Experimentala (Romania)

c INSTITUT LAUE LANGEVIN (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MAGNETIC FIELD EFFECTS; MAGNETIC HYSTERESIS; MAGNETIC RELAXATION; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; NEUTRONS; POLARIZATION; REFLECTION; REFLECTOMETERS; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

COBALT OXIDE; EXCHANGE BIAS EFFECT; POLARIZED NEUTRON REFLECTOMETRY; SPUTTERED MULTILAYERS;

MULTILAYERS;

EID: 0037004095 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390201709 Document Type: Article

Times cited : (12)

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