-
1
-
-
0000653949
-
A level set method for thin film epitaxial growth
-
S. Chen, B. Merriman, M. Kang, R. E. Caflisch, C. Ratsch, L. T. Cheng, M. Gyure, R. P. Fedkiw, and S. Osher. A level set method for thin film epitaxial growth. J. Comp. Phys., 167:1-26, 2001.
-
(2001)
J. Comp. Phys.
, vol.167
, pp. 1-26
-
-
Chen, S.1
Merriman, B.2
Kang, M.3
Caflisch, R.E.4
Ratsch, C.5
Cheng, L.T.6
Gyure, M.7
Fedkiw, R.P.8
Osher, S.9
-
2
-
-
36448998595
-
Theoretical foundations of dynamical Monte Carlo simulations
-
K. A. Fichthorn and W. H. Weinberg. Theoretical foundations of dynamical monte carlo simulations. J. Chem. Phys., 95:1090-1096, 1991.
-
(1991)
J. Chem. Phys.
, vol.95
, pp. 1090-1096
-
-
Fichthorn, K.A.1
Weinberg, W.H.2
-
3
-
-
0027549695
-
Single wafer processing in stagnation point flow CVD reactor: Prospects, constraints and reactor design
-
P. N. Gadgil. Single wafer processing in stagnation point flow CVD reactor: prospects, constraints and reactor design. J. Electron. Mater., 22:171-177, 1993.
-
(1993)
J. Electron. Mater.
, vol.22
, pp. 171-177
-
-
Gadgil, P.N.1
-
4
-
-
0035709262
-
Modeling and control of thin film morphology using unsteady processing parameters: Problem formulation and initial results
-
Orlando, Florida USA
-
M. A. Gallivan, D. G. Goodwin, and R. M. Murray. Modeling and control of thin film morphology using unsteady processing parameters: Problem formulation and initial results. In Proceedings of 40th IEEE Conference on Decision and Control, pages 1570-1576, Orlando, Florida USA, 2001.
-
(2001)
Proceedings of 40th IEEE Conference on Decision and Control
, pp. 1570-1576
-
-
Gallivan, M.A.1
Goodwin, D.G.2
Murray, R.M.3
-
6
-
-
0015326437
-
Simulation of crystal growth with surface diffusion
-
G. H. Gilmer and P. Bennema. Simulation of crystal growth with surface diffusion. J. Appl. Phys., 43:1347-1360, 1972.
-
(1972)
J. Appl. Phys.
, vol.43
, pp. 1347-1360
-
-
Gilmer, G.H.1
Bennema, P.2
-
7
-
-
0027592541
-
Thin films in the integrated circuit industry: Requirements and deposition methods
-
E. H. Granneman. Thin films in the integrated circuit industry: requirements and deposition methods. Thin Solid Films, 228:1-11, 1993.
-
(1993)
Thin Solid Films
, vol.228
, pp. 1-11
-
-
Granneman, E.H.1
-
9
-
-
5244272475
-
Dynamic Monte Carlo simulations of surface-rate processes
-
H. C. Kang and W. H. Weinberg. Dynamic monte carlo simulations of surface-rate processes. Acc. Chem. Res., 25:253-259, 1992.
-
(1992)
Acc. Chem. Res.
, vol.25
, pp. 253-259
-
-
Kang, H.C.1
Weinberg, W.H.2
-
10
-
-
0034895077
-
Multiscale model for epitaxial growth of films: Growth mode transition
-
R. Lam and D. G. Vlachos. Multiscale model for epitaxial growth of films: Growth mode transition. Phys. Rev. B, 6403:396-404, 2001.
-
(2001)
Phys. Rev. B
, vol.6403
, pp. 396-404
-
-
Lam, R.1
Vlachos, D.G.2
-
11
-
-
0000291789
-
Low-dimensional approximations of multiscale epitaxial growth models for microstructure control of materials
-
S. Raimondean and D. G. Valchos. Low-dimensional approximations of multiscale epitaxial growth models for microstructure control of materials. J. Comp. Phys., 160:564-576, 2000.
-
(2000)
J. Comp. Phys.
, vol.160
, pp. 564-576
-
-
Raimondean, S.1
Valchos, D.G.2
-
13
-
-
0031275154
-
Multiscale integration hybrid algorithms for homogeneous-heterogeneous reactors
-
D. G. Vlachos. Multiscale integration hybrid algorithms for homogeneous-heterogeneous reactors. AIChE J., 43:3031-3041, 1997.
-
(1997)
AIChE J.
, vol.43
, pp. 3031-3041
-
-
Vlachos, D.G.1
-
14
-
-
0035794374
-
Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films
-
J. A. Zapien, R. Messier, and R. W. Collin. Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films. Appl. Phys. Lett., 78:1982-1984, 2001.
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 1982-1984
-
-
Zapien, J.A.1
Messier, R.2
Collin, R.W.3
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