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Volumn 1, Issue , 2002, Pages 223-231

Estimation and control of surface roughness in thin film growth using kinetic Monte-Carlo models

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE FILTERING; ESTIMATION; FILM GROWTH; KINETIC THEORY; MATHEMATICAL MODELS; MEASUREMENT ERRORS; MONTE CARLO METHODS; PARTIAL DIFFERENTIAL EQUATIONS; ROUGHNESS MEASUREMENT; SURFACE ROUGHNESS; THIN FILMS; TWO TERM CONTROL SYSTEMS;

EID: 0036993668     PISSN: 01912216     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (14)
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    • Orlando, Florida USA
    • M. A. Gallivan, D. G. Goodwin, and R. M. Murray. Modeling and control of thin film morphology using unsteady processing parameters: Problem formulation and initial results. In Proceedings of 40th IEEE Conference on Decision and Control, pages 1570-1576, Orlando, Florida USA, 2001.
    • (2001) Proceedings of 40th IEEE Conference on Decision and Control , pp. 1570-1576
    • Gallivan, M.A.1    Goodwin, D.G.2    Murray, R.M.3
  • 6
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    • Simulation of crystal growth with surface diffusion
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    • Gilmer, G.H.1    Bennema, P.2
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    • Granneman, E.H.1
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    • Dynamic Monte Carlo simulations of surface-rate processes
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    • (1992) Acc. Chem. Res. , vol.25 , pp. 253-259
    • Kang, H.C.1    Weinberg, W.H.2
  • 10
    • 0034895077 scopus 로고    scopus 로고
    • Multiscale model for epitaxial growth of films: Growth mode transition
    • R. Lam and D. G. Vlachos. Multiscale model for epitaxial growth of films: Growth mode transition. Phys. Rev. B, 6403:396-404, 2001.
    • (2001) Phys. Rev. B , vol.6403 , pp. 396-404
    • Lam, R.1    Vlachos, D.G.2
  • 11
    • 0000291789 scopus 로고    scopus 로고
    • Low-dimensional approximations of multiscale epitaxial growth models for microstructure control of materials
    • S. Raimondean and D. G. Valchos. Low-dimensional approximations of multiscale epitaxial growth models for microstructure control of materials. J. Comp. Phys., 160:564-576, 2000.
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    • Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.