On the use of VHDL simulation and emulation to derive error rates

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn 1, Issue 2, 2002, Pages 253-260

  Lima, F ^a   Rezgui, S ^b   Carro, L ^a   Velazco, R ^b   Reis, R ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^b TIMA LABORATORY   (France)

Author keywords

Fault injection; Field programmable gate arrays; Microprocessor

Indexed keywords

CHARGED PARTICLES; FAILURE ANALYSIS; FIELD PROGRAMMABLE GATE ARRAYS; FLIP FLOP CIRCUITS; MICROCONTROLLERS; MICROPROCESSOR CHIPS; PROBABILITY; RADIATION HARDENING; SENSITIVITY ANALYSIS; TRANSIENTS;

FAULT INJECTION; HARDENED CORE; SINGLE EVENT UPSET;

INTEGRATED CIRCUIT TESTING;

EID: 0036992533     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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