Measurement of aberrations in microlenses using a Shack-Hartmann wavefront sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4767, Issue , 2002, Pages 44-52

  Pulaski, Paul D ^a   Roller, James P ^a   Neal, Daniel R ^a   Ratte, Keith ^a  

^a WaveFront Sciences Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CAMERAS; CHARGE COUPLED DEVICES; DATA REDUCTION; FUSED SILICA; OPTICAL COLLIMATORS; OPTICAL FIBERS; OPTICAL SENSORS; OPTICAL VARIABLES MEASUREMENT; WAVEFRONTS;

APERTURE CONVERTERS; MICROLENS ARRAY; SHACK-HARTMANN WAVEFRONT SENSOR;

MICROLENSES;

EID: 0036983551     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.451325     Document Type: Article

References (3)

1. L. Erdmann et al, Testing of refractive silicon microlenses by use of a lateral shearing interferometer in transmission, " Applied Optics, Vol. 37, No. 4, pp 676-682, 1998
2. D. Malacara, Optical Shop Testing, John Wiley&Sons Inc., New York, 1992
3. W.H. Southwell, "Wavefront estimation from Wavefront slope measurements, " JOSA 70(8), 1980