Eigenvalue and eigenvector information of graphs and their validity in detection of graph isomorphism

ASME 2002 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2002

Volumn 5, Issue , 2002, Pages 421-428

  He, P R ^a   Zhang, W J ^a   Li, Q ^b  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EIGEN-VALUE; EIGENVALUES; EIGENVECTORS; GRAPH ISOMORPHISM; GRAPH SPECTRA; MICRO ELECTRO MECHANICAL SYSTEM; ONE-TO-ONE MAPPINGS; POTENTIAL APPLICATIONS; RECURSIVE PROCEDURE; SCIENCE AND ENGINEERING;

DESIGN; GRAPHIC METHODS; MEMS; MICROELECTROMECHANICAL DEVICES; SET THEORY; TECHNICAL PRESENTATIONS; ELECTROMECHANICAL DEVICES; GRAPH THEORY; MAPPING; NANOSYSTEMS;

EIGENVALUES AND EIGENFUNCTIONS;

EID: 0036979528     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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