Testing-domain dependent software reliability growth models and their comparisons of goodness-of-fit

International Journal of Reliability, Quality and Safety Engineering

Volumn 8, Issue 3, 2001, Pages 205-218

  Yamada, Shigeru ^a   Fujiwara, Takaji ^b  

^a TOTTORI UNIVERSITY   (Japan)

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

Fault detection possibility; Imperfect debugging environment; Software reliability growth model; Testing Domain

Indexed keywords

EID: 26044459298     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539301000475     Document Type: Article

References (9)

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