Optimum control limits for employing statistical process control in software process

IEEE Transactions on Software Engineering

Volumn 28, Issue 12, 2002, Pages 1126-1134

  Jalote, Pankaj ^a   Saxena, Ashish ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^b SYMANTEC RESEARCH LABS   (United States)

Author keywords

Control charts; Inspections reviews; Software metrics; Software process improvement (SPI); Software quality control; Statistical process control (SPC)

Indexed keywords

ERROR ANALYSIS; OPTIMAL CONTROL SYSTEMS; QUALITY CONTROL; STATISTICAL PROCESS CONTROL;

SOFTWARE PROCESS IMPROVEMENT (SPI);

SOFTWARE ENGINEERING;

EID: 0036964042     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.2002.1158286     Document Type: Article

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