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Volumn 4, Issue , 2002, Pages 3344-3349

New trends in power quality measuring instruments

Author keywords

[No Author keywords available]

Indexed keywords

AGGREGATION PERIODS; POWER QUALITY MEASURING INSTRUMENTS;

EID: 0036954062     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2002.1182934     Document Type: Conference Paper
Times cited : (14)

References (8)
  • 1
    • 28644435605 scopus 로고    scopus 로고
    • EMC testing and measurement techniques: Power quality measurement methods
    • IEC-61000-4-30; Basic EMC Publication, July
    • IEC-61000-4-30, EMC Testing and Measurement Techniques: Power Quality Measurement Methods. Basic EMC Publication, July 2001
    • (2001)
  • 2
    • 84872524090 scopus 로고    scopus 로고
    • Voltage characteristics of electricity supplied by public distribution systems
    • EN 50160
    • EN 50160; Voltage characteristics of electricity supplied by public distribution systems. CENELEC
    • CENELEC
  • 3
    • 33747366697 scopus 로고    scopus 로고
    • Practical definitions for powers in systems with nonsinusoidal waveforms and unbalanced loads: A discussion
    • January
    • Emmanuel A, et al., Balcells, J; Practical Definitions for Powers in systems with Nonsinusoidal Waveforms and Unbalanced Loads: A discussion, IEEE Transactions on Power Delivery, January 1996
    • (1996) IEEE Transactions on Power Delivery
    • Emmanuel, A.1    Balcells, J.2
  • 4
    • 0012582424 scopus 로고    scopus 로고
    • EMC. Testing and measurement techniques. Sect.7 General guide on harmonics and inter-harmonics measurements and instrumentation
    • IEC 61000-4-7
    • IEC 61000-4-7; EMC. Testing and measurement techniques. Sect.7 General guide on harmonics and inter-harmonics measurements and instrumentation
  • 5
    • 0030126570 scopus 로고    scopus 로고
    • Power quality assessment via wavelet transform analysis
    • April
    • Santoso, S. et al.; Power quality assessment via Wavelet transform analysis, IEEE Transactions on Power Delivery, Vol. 11, No. 2, pp 924-930, April 1996.
    • (1996) IEEE Transactions on Power Delivery , vol.11 , Issue.2 , pp. 924-930
    • Santoso, S.1
  • 6
    • 0024700097 scopus 로고
    • A theory for multiresolution signal decomposition: The wavelet representation
    • July
    • Mallat, S.; A theory for multiresolution signal decomposition: the wavelet representation, IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. 11, pp 674-69, July 1989.
    • (1989) IEEE Trans. on Pattern Analysis and Machine Intelligence , vol.11 , pp. 674-669
    • Mallat, S.1
  • 7
    • 0012582425 scopus 로고    scopus 로고
    • EMC. Testing and measurement techniques. Sect.15 Flickermeter- Functional and design specifications
    • EN 61000-4-15
    • EN 61000-4-15; EMC. Testing and measurement techniques. Sect.15 Flickermeter- Functional and design specifications
  • 8
    • 0003340924 scopus 로고    scopus 로고
    • Calculating a new reference point for the IEC-Flickermeter
    • VDE Verlag, November/December
    • W. Mombaner, Calculating a new reference point for the IEC-Flickermeter. ETEP Vol.8 No. 6, VDE Verlag, November/December, 1998.
    • (1998) ETEP , vol.8 , Issue.6
    • Mombaner, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.