Light-induced lifetime degradation of commercial multicrystalline silicon wafers

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 395-398

  Dhamrin, Marwan ^a   Akihide, Takaki ^a   Hashigami, Hiroshi ^a   Saitoh, Tadashi ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; DEGRADATION; DIFFUSION; DOPING (ADDITIVES); HEAT EXCHANGERS; PASSIVATION;

ELECTROMAGNETIC CAST; LIGHT INDUCED LIFETIME DEGRADATION; MULTICRYSTALLINE SILICON WAFERS;

SILICON WAFERS;

EID: 0036953875     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. T. Saitoh, et al., Overview of light degradation e-search on crystalline silicon solar cell, Progress in Photovoltaics, Vol. 8, No. 5, 537 (2000)
2. H. Fischer, W. Pschunder, Investigation of photon and thermal induced changes in silicon solar cells, Conference Record of 10th IEEE Photovoltaic Specialists Conference, 1973; 404-411.
3. J. W. Corbett, A. Jaworowski, R. L. Kleinhenz, CB. Pierce, N.D. Wilsey, Photodegeneration in silicon solar cells 1980;2: 11-22.
4. J. Schmidt, A. G. Aberle, R. Hezel, Investigation of carrier lifetime instabilities in Cz-grown silicon, Conference Record of 27 IEEE Photovoltaic Specialists Conference, 1997; 13-18.
5. S. W. Glunz, S. Rein, W. Warta, J. Knobloch, W. Wetling, On the degradation of Cz-silicon solar cells, Proceedings of the 2nd World Conference on Photovoltaic Solar Energy Conversion, 1998; 1343-1346.
6. P. J. Drevinsky, C. E. Cacfer, S. P. Tobin, J. C. Mikkelsen, L. C. Kimerling, Influence of oxygen and boron on defect production in irradiated silicon. Mater. Res. Soc. Proc. 1998; 104: 167-172.
7. J. Schmidt, A. Cuevas, Electronic properties of light-induced recombination centers in boron-doped Czochralski silicon, J. Appl. Phys. 1999; 86(6): 3175-3180.
8. M. Dhamrin, K. Koyanagi, R. Ozaki and T. Saitoh, Quality evaluation and improvement of iron-doped multicrystalline Si wafers, Technical Digest of the International PVSEC-12, 211 (2001).
9. A. Takaki, H. Hashigami and T. Saitoh, Light degradation of minority carrier lifetimes for multicrystalline silicon substrates, Technical Digest of the International PVSEC-12, 215 (2001).