Charging regimes of insulators under low energy electron beam (200 eV to 10 keV)

Proceedings - International Symposium on Electrets

Volumn , Issue , 2002, Pages 11-14

  Blaise, G ^a   Braga, D ^a  

^a UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MOBILITY; ELECTRONS; SCANNING ELECTRON MICROSCOPY;

LOW ENERGY ELECTRON BEAM; SECONDARY ELECTRON EMISSION;

ELECTRIC INSULATORS;

EID: 0036953867     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

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2. J. Densley, et al., Electra no 187, pp. 74-89 (1999).
3. A. Melchinger and S. Hoffman, J. Appl. Phys. 78(10), pp. 6224-6232 (1995).
4. B. Vallayer, G. Blaise and D. Tréheux Rev. of Sci. Instruments, V 70, no 7, p. 3102-3112 (1999).