Raman spectroscopy as a tool for characterization of strained hexagonal GaN/AlxGa1-xN superlattices

Physica Status Solidi (B) Basic Research

Volumn 234, Issue 3, 2002, Pages 975-979

  Davydov, Valery Yu ^a   Smirnov, Alex N ^a   Goncharuk, I N ^a   Kyutt, R N ^a   Scheglov, M P ^a   Baidakova, M V ^a   Lundin, W V ^a   Zavarin, E E ^a   Smirnov, M B ^b   Kappov, S V ^b   Harima, H ^c  

^a IOFFE INSTITUTE   (Russian Federation)

^b ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^c KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036925004     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200212)234:3<975::AID-PSSB975>3.0.CO;2-L     Document Type: Conference Paper

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