SCOPUS 정보 검색 플랫폼

Bunseki Kagaku

Volumn 51, Issue 12, 2002, Pages 1145-1151

On standardizing to voltammetric determination of cupric and cuprous oxides formed on copper

(4) Nakayama, Shigeyoshi a Shibata, Masahiro a Notoya, Takenori b Osakai, Toshiyuki c

a SUMITOMO ELECTRIC INDUSTRIES LTD (Japan)

b HOKKAIDO UNIVERSITY (Japan)

c KOBE UNIVERSITY (Japan)

Author keywords

Copper oxide films; Double sweep cyclic voltammetry; Selective determination of cuprous and cupric oxides; Standard samples

Indexed keywords

COPPER DERIVATIVE; LITHIUM DERIVATIVE; OXIDE; OXYGEN; POTASSIUM HYDROXIDE;

ALKALINITY; ARTICLE; CORROSION; CYCLIC POTENTIOMETRY; DATA ANALYSIS; ELECTRON MICROSCOPY; FILM; GAS; OXIDATION; QUANTITATIVE ANALYSIS; REDUCTION; THICKNESS; X RAY DIFFRACTION;

EID: 0036921723 PISSN: 05251931 EISSN: None Source Type: Journal
DOI: 10.2116/bunsekikagaku.51.1145 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.