Comparison of the morphology and in distribution of capped and uncapped InGaN layers by transmission electron microscopy

Physica Status Solidi (B) Basic Research

Volumn 234, Issue 3, 2002, Pages 947-951

  Potin, V ^a   Rosenauer, A ^a   Gerthsen, D ^a   Kuhn, B ^b   Scholz, F ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036920514     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200212)234:3<947::AID-PSSB947>3.0.CO;2-P     Document Type: Conference Paper

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